Instrumentation and Test Procedures for Neutron Rapid Annealing Tests on TTL MSI Circuits.

Abstract

A special instrument was designed at the Air Force Weapons Laboratory to perform rapid annealing tests on MSI logic circuits. This unit uses high-speed analog comparators to determine the state of the output of the device under test--logic zero, logic one or intermediate. The signals from the comparators are then digitally compared with the expected result which was previously stored. The response of the device under test to 80 input test patterns is determined at four decades of time following a radiation burst.

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1976
Accession Number
ADA029214

Entities

People

  • Craig R. Worcester
  • Phillip A. Young
  • Robert J. Antinone

Organizations

  • Air Force Research Laboratory

Tags

DTIC Thesaurus Topics

  • Air Force
  • Annealing
  • Circuits
  • Comparators
  • Instrumentation
  • Logic
  • Logic Gates
  • Measuring Instruments
  • Radiation

Readers

  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.