Study of Electronic Transport and Breakdown in Thin Insulating Films
Abstract
Recent progress is reported on an ongoing program of studies of high- field electronic injection, transport, trapping, and dielectric breakdown in thin insulating films. The studies include corona-induced high-field injection and trapping, the combined use of corona and optical excitation, an investigation of the high-field generation of interface states, a study of high- field instabilities in the MOS system, and use of the scanning electron microscope to study lateral nonuniformities.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1976
- Accession Number
- ADA029314
Entities
People
- Walter C. Johnson
Organizations
- Princeton University