Thin Film Characterization by a Guided Light Technique.
Abstract
Zinc telluride films were fabricated by sputtering onto glass substrates using argon as the sputtering gas and ion exchange waveguides were made by exchanging the sodium atoms of a glass substrate for the silver atoms of a silver nitrate bath. Guided light techniques were than applied to both the zinc telluride films and the ion exchange waveguides in order to determine the modes of propagation. The waveguide modes were determined in the ion exchange waveguides but there were not any modes of propagation observed in the zinc telluride films. The determination of the modes of propagation for the ion exchange waveguides allowed their characterization to be done. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1975
- Accession Number
- ADA030036
Entities
People
- Stanley R. Czyzak
Organizations
- Air Force Institute of Technology