Production Engineering Measure (PEM) for High Current, Fast-Switching Transistors.

Abstract

During this period, the First Article Test Report was approved. A plant survey was conducted to monitor production rates. Permission was obtained to start the pilot run. The pilot run was begun. Electrical and physical parameters of selected runs are shown. 400 chips were selected for encapsulation. A total of 232 devices were accepted at pre-cap visual inspection showing that the program is on schedule. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 13, 1975
Accession Number
ADA032822

Entities

People

  • Frederick G. Ernick

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Corporations
  • Encapsulation
  • Engineering
  • Fabrication
  • Failure Mode And Effect Analysis
  • Inspection
  • Life Tests
  • Production Engineering
  • Production Rate
  • Semiconductor Devices
  • Semiconductors
  • Specifications
  • Standards
  • Test And Evaluation
  • Test Methods
  • Transistors
  • Visual Inspection

Readers

  • Software Engineering