Grain Boundary Segregation and Stress Corrosion Cracking of Aluminum Alloys

Abstract

Auger electron spectroscopy and chemical depth profiling by argon sputtering were employed to obtain the grain boundary segregation profiles of various aluminum alloys. Samples of both commercial (7075, 7050, and 7049) and high purity alloys based on the Al-Zn-Mg ternary in different heat treatments were examined following in situ fracturing in the spectrometer. Segregation profiles indicate that the grain boundaries in these alloys are considerably enriched in Mg and Zn. In commercial alloys, however, the grain boundaries are depleted in the minor elements Fe, Cu and Si. AES spectra of oxide films formed on Al-Zn-Mg alloys indicate that the enhanced segregation along the grain boundaries results in a film rich in Mg. It is postulated that incorporation of extensive amounts of these alloying elements into the film renders it less protective and leads to enhanced hydrogen entry and embrittlement by stress corrosion cracking.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1976
Accession Number
ADA033096

Entities

People

  • J. A. Green
  • R. K. Viswanadham
  • T. S. Sun
  • W. G. Montague

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Alloys
  • Aluminum
  • Auger Electron Spectroscopy
  • Auger Electrons
  • Electron Spectroscopy
  • Electronics Industry
  • Grain Size
  • Materials
  • Materials Engineering
  • Materials Science
  • Measurement
  • Oxide Films
  • Solid Solutions
  • Spectra
  • Spectroscopy
  • Stress Corrosion
  • Stress Corrosion Cracking

Fields of Study

  • Materials science

Readers

  • Metallurgy
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene