Failure Distributions of Shock Models.

Abstract

This paper, considers a single device shock model. The device experiences shocks from the environment, each of which can render the device inoperable. Conditions of the shock process and of the ability of the device to survive shocks are found so that the time to failure distribution of the device falls into one of the common reliability theory classifications. These results are extended to the case where the shock process can be viewed as continuous.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Oct 18, 1976
Accession Number
ADA033430

Entities

People

  • Gary Gottlieb

Organizations

  • Stanford University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • California
  • Classification
  • Convolution
  • Distribution Functions
  • Governments
  • Inequalities
  • Markov Processes
  • Military Research
  • Operations Research
  • Probability
  • Random Variables
  • Reliability
  • Sequences
  • Stochastic Processes
  • United States
  • United States Government

Readers

  • Explosive Engineering.
  • Logistics and Supply Chain Management.
  • Theoretical Analysis.