Microcircuit Device Reliability Digital Detailed Data

Abstract

This compendium of microcircuit device reliability is separated into two parts: 'Summarized Digital Information' and 'Digital Device Data - Detailed Listings'. The summaries pertain to burn-in test results, environmental/ screening information and die and package related malfunctions. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1976
Accession Number
ADA033937

Entities

People

  • Mark R. Klein

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Digital Information
  • Electrical Measurement
  • Environmental Tests
  • Failure Mode And Effect Analysis
  • Frequency
  • Life Tests
  • Materials
  • Measurement
  • Plastic Explosives
  • Stress Tests
  • Test And Evaluation
  • Test Methods
  • Three Dimensional
  • Two Dimensional
  • Visual Inspection

Readers

  • Computer Science.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems