EMP Preferred Test Procedures (Selected Electronic Parts). Revision

Abstract

EMP preferred test procedures are provided to evaluate and characterize the performance of a number of electrical devices. Topics covered are experiment design, documentation, typical induced EMP transients, and the specific test procedures to evaluate the EMP behavior for each type of electronic component.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1976
Accession Number
ADA034791

Entities

People

  • J. E. Bridges
  • L. C. Peach
  • V. P. Nanda
  • W. C. Emberson
  • W. C. Wells

Organizations

  • IIT Research Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Capacitors
  • Dielectrics
  • Electromagnetic Fields
  • Electromagnetic Radiation
  • Electromagnetic Shielding
  • Electronic Components
  • Frequency Bands
  • Magnetic Detectors
  • Materials
  • Measurement
  • Radio Frequency
  • Repetition Rate
  • Semiconductors
  • Signal Generators
  • Test And Evaluation
  • Test Methods
  • Waveforms

Readers

  • Aerospace Test and Evaluation
  • Systems Analysis and Design

Technology Areas

  • Microelectronics