Intrinsic and Thermal Stress Modelling for Thin-Film Multilayers

Abstract

The measurement of induced stresses and thermally induced stresses in thin-film multilayer coatings is being investigated using an interferometric technique. Stress data is to be incorporated into a model for the prediction of thermally induced failure mechanisms in antireflection coatings for KCl windows at 10.6 micrometers.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1976
Accession Number
ADA035513

Entities

People

  • A. M. Ledger
  • R. C. Bastien

Tags

DTIC Thesaurus Topics

  • Antireflection Coatings
  • Coatings
  • Failure Mode And Effect Analysis
  • Films
  • Measurement
  • Micrometers
  • Stresses
  • Thermal Stresses
  • Thin Films

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nanofabrication and Microfabrication.
  • Surface Coatings Technology.