MOS Transistor Drivers for Large Capacitive Loads.

Abstract

The advent of MOS large-scale integration (LSI) has focused considerable research activity into studying the compromises involved in efficient integrated circuit design. These trade-offs may involve circuit size, device parameters, circuit speed, and extra processing steps. Available chip size, manufacturing tolerance, and cost place upper and lower limits on the range each of these can take. There may also be some concern about requiring several voltage sources or complicated clocking sequences which cannot be derived on the chip. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1976
Accession Number
ADA036362

Entities

People

  • Paul Fielding Smith

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Air Force
  • Capacitance
  • Capacitors
  • Circuit Analysis
  • Circuits
  • Computer Simulations
  • Computers
  • Electrical Engineering
  • Fabrication
  • Illinois
  • Integrated Circuits
  • Large Scale Integration
  • Lepidoptera
  • New York
  • Simulations
  • Time Intervals
  • United States

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design