Nomograms for the Design of Single Sample Reliability Acceptance Plans for Exponential Distribution.

Abstract

This report presents nomograms for the design and evaluation of single sample reliability acceptance tests for exponential distribution. The nomograms permit an exploration of the design region and facilitate the examination of alternative solutions and their implications. The nomograms constitute a useful tool for the practicing engineer to weigh the trade-offs between design and test criteria. Several examples are presented to illustrate the use of the nomograms toward plan design, exploration of the design region, examination of the effects of changes in design criteria on the designed plans, design with engineering constraints and design with partial information. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1977
Accession Number
ADA036654

Entities

People

  • Amrit L. Goel
  • Anand M. Joglekar

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Consumers
  • Design Criteria
  • Electricity
  • Engineering
  • Engineers
  • Equations
  • Flux Density
  • Industrial Engineering
  • Information Science
  • Magnetic Fields
  • Magnetic Flux
  • Magnetic Flux Density
  • New York
  • Operations Research
  • Radiant Intensity
  • Random Variables
  • Reliability

Readers

  • Software Engineering
  • Systems Analysis and Design