Radiation-Hardness Testing of Electronic Devices: A Survey of Facility Dosimetry Practices.
Abstract
As part of a program to develop better quality assurance in the measurement of total dose in the field of radiation-hardness testing of electronic devices, a survey was conducted at twelve radiation test facilities. The survey was carried out through personal visits during which various characteristics of the test facilities and dosimetry procedures were noted. This report summarizes the results of the survey. Particular attention is given to the types of dosimetry problems perceived by the dosimetry personnel at the facilities as well as to general observations by the surveyor. The observations and information obtained through this survey led to some conclusions on where problems in total-dose measurements may occur. Some specific recommendations result and give direction to the program plan for developing more consistent measurement procedures within the radiation-hardness testing community. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1976
- Accession Number
- ADA036669
Entities
People
- J. C. Humphreys
- S. E. Chappell
Organizations
- National Institute of Standards and Technology