International Conference on Radiation Effects in Semiconductors.

Abstract

Selected papers given at this Conference are briefly reviewed. The meeting emphasized how much is still unknown concerning the nature of defects in semiconductors other than silicon, as well as the need to develop other microscopic probes for investigating materials that are not readily amenable to ESR studies. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 24, 1977
Accession Number
ADA036994

Entities

People

  • James H. Schulman
  • Neal D. Wilsey

Organizations

  • Office of Naval Research

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Space

DTIC Thesaurus Topics

  • Ceramic Materials
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Fast Neutrons
  • Impurities
  • Low Temperature
  • Materials
  • Military Research
  • Pair Production
  • Point Defects
  • Radiation
  • Radiation Effects
  • Semiconductors
  • Silicon
  • Silicon Carbide
  • Solid State Physics

Readers

  • Academic Conference Management
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics