Low-Frequency Noise in (HG, CD) TE Detectors.

Abstract

The purpose of this study was to identify and understand the sources of 1/f noise in n-type HgCd Te detectors and to recommend methods for reducing this noise. Four items were investigated: a) Noise generated at noisy contacts. This could be interpreted as injection 1/f noise. b) Noise at grain boundaries. We found devices with grain boundaries to be noisier than those without it; in our geometry the difference was a factor 4. c) Noise generated at the surface versus bulk noise. We found the noise to be more variable from sample to sample than bulk noise permits. We also showed by a direct experiment (MIS devices) that the flicker noise was surface generated. d) A modulation technique was developed for discriminating between noise sources, but was not used in the experiments under (c). (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1976
Accession Number
ADA037185

Entities

People

  • Aldert Van Der Ziel
  • Hussein Ibrahim Hanafi

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Amplifiers
  • Crystal Structure
  • Detectors
  • Electrical Engineering
  • Electronic Circuits
  • Electrons
  • Energy Bands
  • Equations
  • Frequency Modulation
  • Light Sources
  • Materials
  • Materials Laboratories
  • Semiconductor Devices
  • Semiconductors
  • Signal Generators
  • Surface Properties

Readers

  • Acoustics.
  • Semiconductor Device Technology
  • Systems Analysis and Design