Protective Coaxial Switching Devices.

Abstract

The use and performance of NbO/NbO2 chips supplied by ECOM in a coaxial switching device has been investigated. The material does exhibit switching with a delay time of less than 1 ns. The threshold switching voltage is typically 100 to 300 V. A manufacturable packaging configuration with evaporated small area contacts has been developed and fifty (50) completed devices have been supplied. Step by step details of all pertinent fabrication procedures, from selection of as received chips to final mounting and wire bonding of the completed unit are described. Device stability for a range of pulse lengths has also been investigated and is discussed in some detail. The electrical parameters of the as supplied chips do not however meet the specifications listed in the Technical Guidelines DAAB07-76-Q-1335 which require a threshold switching voltage <100. In addition, device degradation with repeated pulsing is observable even for 3 ns pulse widths and is markedly accelerated for larger pulse widths. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1977
Accession Number
ADA038087

Entities

People

  • G. A. Slack
  • H. R. Philipp
  • L. M. Levenson

Organizations

  • General Electric

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  • Advanced Electronics
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Fields of Study

  • Physics

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  • Aerospace Test and Evaluation
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