Comparison of Measuring Times for X-Ray Determination of Residual Stresses: A Normal Detector and a Position Sensitive Detector.

Abstract

The use of a position sensitive detector (PSD) in the measurement of residual stress by the X-ray technique has been described previously (see T.R. No. 11). To quantify the actual time savings for the stress determination, a complete comparison was carried out between a normal diffractometer measurement and a PSD measurement. The speed of the PSD is dependent on the profile characteristics and the desired accuracy of the measurement. Therefore, measurements were carried out on six steel samples covering the full range of peak breadths and for both a high and a low statistical counting accuracy. In all cases, the PSD was considerably faster than the normal detector, from 100 times quicker for the most favorable case (sharp profile, high statistical error) to twice as fast (broad profile, low statistical error) for the least favorable case. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 15, 1977
Accession Number
ADA038103

Entities

People

  • Jerome B. Cohen
  • Michael R. James

Organizations

  • Northwestern University

Tags

DTIC Thesaurus Topics

  • Accuracy
  • Detectors
  • Diffraction
  • Diffractometers
  • Errors
  • Measurement
  • Precision
  • Residual Stress
  • Residuals
  • Scattering
  • Scintillation Counters
  • Stress Analysis
  • Stresses
  • X Ray Scattering
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Geodesy
  • Statistical inference.
  • Systems Analysis and Design