Advanced Development AN/USM-410 (XE-3) (V) Electronic Equipment Test Station (EQUATE).
Abstract
A third-generation Automatic Test Equipment (ATE) has been developed with the capability for functional test and diagnostic fault isolation testing of a wide variety of electronic assemblies, subassemblies and modules. A brief history of ATE is given leading to the initial development of the EQUATE (Electronic Quality Assurance Test Equipment) system, which was later assigned the official nomenclature of AN/USM-410 () (V). Advanced development of the EQUATE system has focussed on the expansion of low-frequency stimulus/measurements capability to 500 MHz, improvements in RF/microwave capability for stimulus/measurement extension to 18 GHz, and development of a fully programmable interface. The addition of a Programmable interface Unit (PIU) where each pin can be configured as a stimulus, analog/digital measurement, or load point, includes dynamic digital test capability at rates up to 2 MHz. The result of this development is the AN/USM-410 (XE-3) (V) Test Station, capable of functional and diagnostic fault isolation testing of analog, analog/digital and purely digital electronic assemblies, subassemblies and modules. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1977
- Accession Number
- ADA038287
Entities
People
- R. P. Percoski