Improved Surface Damage by Radio-Frequency Sputtered Overcoating.
Abstract
Ten dielectric materials were deposited in half-wavelength optically thick films on dielectric substrate with varying surface roughness. The films were subjected to damaging radiation from a TEM mode ND(+3) in glass laser operating at 1.06 micrometers. The threshold optical field for damage was determined for each film. It was demonstrated that substrate roughness was an overriding consideration in the thin-film thresholds and that no masking of defects by the film was exhibited. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1977
- Accession Number
- ADA038358
Entities
People
- Jerry R. Bettis
Organizations
- Air Force Research Laboratory