Fabrication and Testing of MOS Scaler/Logic and Overhead Safety Integrated Circuit.

Abstract

This report presents the results of the fabrication and test effort of a MOS/LSI integrated circuit used in the XM587E2/XM724 Electronic Time Fuze designed by Harry Diamond Laboratories (HDL). The integrated circuit performs the scaling and overhead safety functions of the fuze system. The device was designed and produced under contract DAAG39-74-C-0161. The MOS-LSI circuit was successfully fabricated and tested to all requirements of contract DAAG39-75-C-0146. One thousand first-article devices and six thousand production devices were successfully qualified and then shipped to HDL. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1976
Accession Number
ADA038513

Entities

People

  • Gerald L. Donaldson

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Acceptance Tests
  • Artillery
  • Circuits
  • Classification
  • Communication Systems
  • Contracts
  • Engineering
  • Fabrication
  • Governments
  • Identification
  • Industrial Engineering
  • Inspection
  • Integrated Circuits
  • Specifications
  • Test And Evaluation
  • Three Dimensional
  • Time Fuzes

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene