Optimal Inspection Schedules for Failure Detection when Tests Hasten Failures.

Abstract

Methods are well known for determining testing times to minimize the mean cost of testing plus mean cost of an undetected failure (linear in the mean time between failure and detection), when testing does not degrade a good system. Here, we introduce a model in which the ith test may either cause a failure, with probability beta, or increase the remaining failure rate to lambda(i) > lambda(i-7) without changing the form of the conditional lifetime distribution. Algorithms are given for finding the best testing times in cases of uniform and exponential failure time distributions. Optimization over a single cycle is considered first, and then the case with component renewals is solved using the mean loss per unit time criterion. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1976
Accession Number
ADA038517

Entities

People

  • Leonard Shaw
  • Nikorn Wattanapanom

Tags

Communities of Interest

  • C4I

DTIC Thesaurus Topics

  • Algorithms
  • Damage Detection
  • Detection
  • Dynamic Programming
  • Electrical Engineering
  • Heuristic Methods
  • Inspection
  • Long Life
  • Mathematical Models
  • Military Research
  • Models
  • New York
  • Optimization
  • Probability
  • Random Variables
  • Reliability
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Inertial Navigation Systems.
  • Mathematical Modeling and Probability Theory.
  • Systems Analysis and Design