Digital Microcircuit Characterization and Specification.

Abstract

The objective of this effort was to generate MIL-M-38510 slash sheets for microprocessor integrated circuits. The report includes the general microprocessor test philosophy developed and used, technical analyses of manufacturer generated functional test programs, changes made to manufacturer programs, and the approach taken in slash sheet development. Two slash sheets were developed; /400 for the 6800 and /420 for the 8080A microprocessor (not included in the report). Also included are analyses of functional tests for many low power Schottky flip flops and one CMOS register circuit (CD4035A). (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1977
Accession Number
ADA038969

Entities

People

  • Thomas M. Ostrowski

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Counter IED
  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Accuracy
  • Charge Transfer
  • Computer Programming
  • Computer Programs
  • Computers
  • Contracts
  • Data Storage Systems
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Large Scale Integration
  • Measurement
  • Schematic Diagrams
  • Semiconductors
  • Test And Evaluation
  • Test Equipment
  • Very Large Scale Integration
  • Voltage

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics