Mechanisms of Emitter Surface Damage During EHD Colloid Particle Generation and Acceleration.
Abstract
A model of emitter tip erosion has been developed that correlates with performance degradation. The erosion is caused by back bombardment of the emitter by negative ions produced from the break up of slow droplets as a result of collisions with fast ions. Calculations are made assuming the droplets are all the same size rather than using the distribution of droplet sizes actually observed. If at least one negative ion is produced at each ion/droplet collision the resulting sputtering date is sufficient to explain the measured erosion.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1977
- Accession Number
- ADA038982
Entities
People
- John F. Mahoney
- Julius Perel