Grain Boundary Segregation of a Al-Zn-Mg Ternary Alloy.

Abstract

Auger electron spectroscopy (AES) has been used to measure the grain boundary concentration profiles of alloy additions in a A1-5.5% Zn-2.5% Mg ternary. The AES depth profiles show marked segregation of Mg and Zn to the grain boundary, in contrast to that reported previously on similar Al alloys. It is found that this apparent contradiction can be resolved by exploiting the plasmon-loss features of the AES spectra to help elucidate the grain boundary segregation. With the AES/plasmon-loss measurements, one can determine not only the concentration of Mg and Zn at the grain boundary, but also the metallurgical environments surrounding the alloy additions. It is shown that, for over-aged specimens of the Al alloy, only a fraction of the total Mg at the grain boundary is incorporated in MgZn2 precipitates, the remainder being segregated to within a few atomic layers of the boundary. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1977
Accession Number
ADA039014

Entities

People

  • J. A. S. Green
  • J. M. Chen
  • R. K. Viswanadham
  • T. S. Sun

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Electron Beams
  • Electron Spectroscopy
  • Electronics Laboratories
  • Electrons
  • Grain Size
  • Heat Treatment
  • Libraries
  • Materials
  • Materials Engineering
  • Materials Science
  • Mechanical Properties
  • Metals
  • Military Research
  • Spectroscopy
  • Universities

Fields of Study

  • Materials science

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  • Powder metallurgy of Titanium alloys.
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Technology Areas

  • Microelectronics