Spectral and Total Emissivity and Reflectivity at High Temperatures

Abstract

The automated high temperature emissometer for the accurate measurement of spectral emissivity from 0.6 to 11 micrometers and also total emissivity is described. This emissometer is used in conjuction with the multiproperty apparatus which measures a number of thermophysical properties on the same specimen. Spectral emissivity data for tantalum at 1500K measured with the emissometer is compared to literature values. These data were found to generally agree within 2% below 7 micrometers, but to diverge at longer wavelengths. With the use of improved amplifiers and of signal detectors with increased sensitivity, the accuracy above 7 micrometers is expected to improve significantly.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1977
Accession Number
ADA039209

Entities

People

  • D. P. Dewitt
  • R. E. Taylor

Organizations

  • Purdue University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Acquisition
  • Computer Programs
  • Computers
  • Data Acquisition
  • Detection
  • Detectors
  • Digital Data
  • Electrodes
  • Emissivity
  • Emittance
  • High Temperature
  • Measurement
  • Mechanical Engineering
  • Power Supplies
  • Silica Glass
  • Surface Properties

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.