A High Pressure X-Ray Study of Nylon 11.

Abstract

An x-ray diffraction study of Nylon 11 was carried out at high pressures and high temperatures. Careful measurements made on both wet and dry samples at atmospheric pressure indicated that the structure of Nylon 11 suggested by Slichter was not quite correct. Some distortion of the planar conformation causes a shortening of the c repeat distance from the value required for a fully extended conformation. The compressibility of the crystal lattice at higher pressures up to 20kb was studied and related to the anisotropic bonding present in the structure. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1977
Accession Number
ADA039383

Entities

People

  • B. A. Newman
  • K. D. Pae
  • T. P. Sham

Organizations

  • Rutgers University–New Brunswick

Tags

DTIC Thesaurus Topics

  • Barometric Pressure
  • Crystal Lattices
  • Crystal Structure
  • Dielectric Polymers
  • Distortion
  • High Pressure
  • High Temperature
  • Materials
  • Materials Science
  • Measurement
  • Mechanics
  • Military Research
  • Phase Diagrams
  • Phase Transformations
  • Transition Temperature
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science and Engineering.
  • Surface Coatings Technology.