EMP Preferred Test Procedures. Revision

Abstract

IIT Research Institute has developed EMP PREFERRED TEST PROCEDURES for selected electronic components. This is part of a continuing program to formulate and recommend procedures by which EMP test data may be obtained and reported. In this connection, it is important to realize what these preferred procedures are and what they are not. They are a formal recognition of good practices and methods based on sound physical principles which can lead to useful EMP data. They provide a means of communicating useful information among workers in a large multidisciplined technology. These preferred procedures are not necessarily cook-book simplifications and are not intended to be a MIL-SPEC or a panacea for designers of hardened systems. The EMP PREFERRED TEST PROCEDURES require some experience and intelligence on the part of the experimenter.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1977
Accession Number
ADA039768

Entities

People

  • J. E. Bridges
  • L. B. Townsend
  • L. C. Peach
  • W. C. Emberson
  • W. C. Wells

Organizations

  • IIT Research Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Aircrafts
  • Amplifiers
  • Capacitors
  • Computers
  • Detectors
  • Electronic Components
  • Engineering
  • Frequency
  • Hardening
  • Impedance
  • Measurement
  • Repetition Rate
  • Specifications
  • Standards
  • Test Equipment
  • Test Fixtures
  • Waveforms

Readers

  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Regression Analysis.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics