Random Access Memory Fault Location Capability of the Algorithm Test Sequence.

Abstract

This report describes an Algorithm Test Sequence (ATS) designed to provide an optimal test sequence for detecting stuck-at faults in a random access memory. An analysis of its capability to locate any single stuck-at fault is provided. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1977
Accession Number
ADA040159

Entities

People

  • C. R. P. Hartmann
  • John Knaizuk Jr.

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Algorithms
  • Computer Programs
  • Computers
  • Electric Current
  • Electricity
  • Engineering
  • Engineers
  • Flux Density
  • Industrial Engineering
  • Magnetic Fields
  • Magnetic Flux
  • Magnetic Flux Density
  • Operations Research
  • Plastic Explosives
  • Sequences
  • Thermal Conductivity
  • Voltage

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Applied Combinatorial Optimization and Logic Circuit Design.