Functional Level Modeling of Complex Elements in TEST/80,

Abstract

This report documents the result of just one task of our contract. This task was to investigate the feasiblity of handling complex elements functionally, rather than at the logic level, in an ATG system. We have assumed a test generation system based upon the concepts of path sensitization a la the D-alorithm. In this report we demonstrate this feasiblity. MOre precisely, we have developed function models for three devices (a flip-flop, a counter, and a shift register). These models include mechanisms for processing implication, D-drive and line justification. We introduce concepts for dealing with both edge-triggered and level devices, as well as a generic language for specifying the functional operation of a device. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1976
Accession Number
ADA040269

Entities

People

  • Melvin A. Breuer

Tags

Communities of Interest

  • C4I
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Composite Materials
  • Crystal Structure
  • Demographic Cohorts
  • Equations
  • Language
  • Logic
  • Sequences
  • Shift Registers
  • Simulations
  • Simultaneous Equations
  • Terminals
  • Test And Evaluation
  • Translators

Readers

  • Artificial Intelligence
  • Integrated Circuit Design and Technology.