An Advanced Automatic Test Generation System for Digital Circuits,

Abstract

This is the third and final report documenting our research into the design of a new and powerful automatic test generation system for digital logic, called TEST/80. This system is designed around the following six concepts. 1. A powerful circuit preprocessing analysis which leads to greater efficiency during stimulus generation. 2. An effective initialization algorithm. 3. The use of time frames, phases and periods so that asynchronous circuits can be accurately processed during stimulus generation. 4. The use of functional level primitives so that complex circuits including shift registers, counters and RAM's, can now be effectively processed. 5. The use of a stimulus generation algorithm which incorporates the concepts in 1-4. 6. The use of a functional level concurrent fault simulator, used to grade a test and produce a fault dictionary.

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Document Details

Document Type
Technical Report
Publication Date
Mar 29, 1977
Accession Number
ADA040271

Entities

People

  • Melvin A. Breuer

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Algorithms
  • Circuits
  • Computations
  • Cost Analysis
  • Costs
  • Decoding
  • Demographic Cohorts
  • Digital Circuits
  • Logic
  • Logic Gates
  • Notation
  • Preprocessing
  • Shift Registers
  • Side Effects
  • Simulations
  • Simulators

Fields of Study

  • Engineering

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Computer Vision.
  • Software Engineering