Dual-Mode Logic for Function Independent Fault Testing.

Abstract

A method of using hardware redundancy to ease the problem of fault testing in combinational and sequential logic circuits is presented. Dual-mode logic gates are used to construct combinational logic circuits which can be tested for all single stuck-at faults using just two function-independent tests. Analogous results for sequential circuits are also presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1977
Accession Number
ADA040611

Entities

People

  • C. R. P. Hartmann
  • L. D. Rudolph
  • Sayak Dasgupta

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Angular Acceleration
  • Circuits
  • Dual Mode
  • Engineering
  • Engineers
  • Flux Density
  • Industrial Engineering
  • Logic
  • Logic Gates
  • Magnetic Flux
  • Magnetic Flux Density
  • Nand Gates
  • Networks
  • Radiant Intensity
  • Redundancy
  • Test Sets

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.