Manufacturing Methods and Technology Engineering High Efficiency, High Power Gallium Arsenide Read-Type IMPATT Diodes.

Abstract

The X-band and Ku-band confirmatory sample wafers were processed into dice and evaluated. The confirmatory sample diodes were assembled and tested. Group B testing is being performed on the diodes. Installation and characterization of the thermal resistance testing equipment was completed. The noise measuring equipment was also completed and installed. The fifth operating life test was completed for the Ku-band diodes only. Priority for testing of X-band diodes was assigned to the confirmatory samples, delaying start of the fifth X-band life test. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1977
Accession Number
ADA041533

Entities

People

  • H. R. Chalifour
  • S. R. Steele

Organizations

  • RTX

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Diodes
  • Electronic Components
  • Electronics
  • Electronics Laboratories
  • Engineering
  • Frequency
  • Gallium Arsenides
  • Impatt Diodes
  • Integrated Circuits
  • Manufacturing
  • New York
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • Thermal Resistance
  • X Band

Readers

  • Semiconductor Device Technology
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems