Discrete Semiconductor Reliability Transistor/Diode Data

Abstract

This second edition of Discrete Semiconductor Reliability, Transistor and Diode Data contains failure rates and failure analysis data from actual field use conditions, in-house checkout and reliability tests performed at the equipment-level.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1977
Accession Number
ADA041964

Entities

People

  • David B. Nicholls
  • Roy C. Walker

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Crystal Structure
  • Electronics Industry
  • Electronics Laboratories
  • Field Effect Transistors
  • Modules (Electronics)
  • Optoelectronic Devices
  • Plastic Explosives
  • Power Electronics
  • Radio Communications
  • Rectifiers
  • Semiconductor Devices
  • Semiconductors
  • Varactor Diodes
  • Zener Diodes

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics