An Electrical, Chemical and Structural Study of the Ge(100)/Cs/O Photosurface.

Abstract

The Ge(100)/Cs/O photosurface and surfaces at intermediate stages of activation are characterized in terms of photoemission, work function, Auger electron spectroscopy (AES), low energy electron diffraction (LEED), and elastic specular electron reflectivity (ESER). An electrical and structural model is proposed for Ge/Cs/O which is consistent with this data. A number of experiments are reported which investigate the sensitivity of the Ge/Cs/O surface to deviations from chemical and structural perfection. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1977
Accession Number
ADA042073

Entities

People

  • Richard Edward Erickson

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Auger Electrons
  • Capillary Electrophoresis
  • Crystal Structure
  • Diffraction
  • Electrical Engineering
  • Electron Spectroscopy
  • Electronics Laboratories
  • Electrons
  • Energy Bands
  • Ions
  • Measurement
  • Photoelectric Emission
  • Sites
  • Spectra
  • Spectroscopy
  • Tin

Fields of Study

  • Materials science

Readers

  • Thin Film Deposition Science.
  • Underwater engineering and Marine Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene