Surface Detail and Backscatter from Coherently Illuminated Targets Rotating about the Axis of Symmetry.
Abstract
A theoretical analysis of the ratio of rms backscattered intensity fluctuation to average intensity for a coherently illuminated target rotating about an axis of symmetry is presented in this report. The ratio delta I sub rms/<I> depends on the rms random phase fluctuation and the number of decorrelation area cells on the exposed target surface. For the case where the random phase fluctuations are due to surface roughness, the ratio depends on the equivalent surface detail parameters: (1) rms height fluctuation and (2) the product of average roughness slope and the square root of the exposed target surface. The ratio delta I sub rms/<I> is also dependent on the illumination wavelength, and the two surface detail parameters can be uniquely determined if the wavelength dependence of the ratio is measured. The analysis presented is especially relevant to laser radar applications. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1977
- Accession Number
- ADA042349
Entities
People
- J. Lynn Smith