Predicting Job Difficulty in High Aptitude Career Ladders with Standard Score Regression Equations.

Abstract

This report was designed to validate a method for evaluating the difficulty levels of Air Force enlisted jobs. Multiple regression equations which captured the job difficulty evaluation policy of supervisors in two electronics and two general career ladders were produced. The equations yielded predicted difficulty values for 250 jobs from each career ladder. These values correlated above .81 with supervisory rankings of job difficulty validating the findings of previous job difficulty studies conducted in 12 Air Force career ladders. Various constant standard weight equations were developed and compared. Of these, an equation derived from all 16 career ladders offered valid predictions when it was applied in the electronics area. Although this 16-ladder equation showed no significant improvement over the 12-ladder equation, it has wider applicability than the 12-ladder equation currently in use. The 16-ladder equation is recommended as a replacement because it is based upon results from all four aptitude areas and because it has been successfully applied in career ladders with both high and low aptitude entrance requirements. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1977
Accession Number
ADA043080

Entities

People

  • Kenneth G. Koym

Organizations

  • Brooks Air Force Base

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Human Systems

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Computational Science
  • Data Analysis
  • Government Procurement
  • Human Resources
  • Information Science
  • Inventory
  • New York
  • Observers
  • Personnel Development
  • Personnel Management
  • Radio Communications
  • Regression Analysis
  • Standards
  • Supervisors
  • Test And Evaluation

Readers

  • Finite Element Method (FEM) for solving Partial Differential Equations (PDEs)
  • Occupational Health and Safety.
  • Psychometric Testing or Psychological Assessment.

Technology Areas

  • Microelectronics