Integrated Circuit Electromagnetic Susceptibility Investigation. Phase III.
Abstract
This report summarizes in a general manner the progress made in investigations into the susceptibility of integrated circuits (ICs) to RF power. This is an interim report covering the work performed in the second of three increments. This increment includes expansion of the modeling effort to incorporate the transistor models into a standard circuit analysis program SPICE (Simulation Program with Integrated Circuit Emphasis) so that RF effects on ICs can be modeled. The testing necessary to support the modeling effort is also included. A complete study of the damage mechanisms suffered by ICs under RF stress is also included in this report as second increment work. This damage study includes both modeling and an extensive testing program. The changes to the first draft of the IC susceptibility handbook and the rationale behind the changes are also included in this report. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 03, 1977
- Accession Number
- ADA043776
Entities
People
- C. E. Larson
- C. N. Kohlberg
- C. R. Chubb
- J. M. Roe
- J. R. Chott