Nondestructive Inspection of Phosphoric Acid Anodized Aluminum Panels for Contamination.

Abstract

This report describes a study of nondestructive inspection (NDI) for contaminants on phosphoric acid anodized aluminum alloys (A1 7075-T6 and A1 2024-T3). Contamination is used in the broad sense to include surface preparation process errors (such as incorrect anodize time or voltage) and handling damage as well as organic contamination from humans and smog. Panels were deliberately contaminated to various levels and then inspected by automated scanning with three surface tools. The tools were, ellipsometry, surface potential difference (SPD), and water contact angle. Ellipsometry proved to be the most useful, detecting all types of contamination. SPD was partially successful for processing errors and organic contamination but was not successful for handling damage. Contact angle measurements were successful for nonpolar organic contamination only. The anodic films are too thick for useful photoelectron emission (PEE) but this technique is very useful for other surface treatment such as FPL etch. The best NDI instrument should include ellipsometry and SPD but ellipsometry alone will probably be adequate. SPD alone would not be adequate. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1977
Accession Number
ADA044241

Entities

People

  • Tennyson Smith

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Alkanes
  • Aluminum Alloys
  • Benzoic Acids
  • Chemical Analysis
  • Chemical Reactions
  • Computer Programs
  • Detectors
  • Fatty Acids
  • Materials
  • Materials Laboratories
  • Measurement
  • Refractive Index
  • Stearic Acid
  • Surface Properties
  • Surface Roughness
  • Two Dimensional

Readers

  • Environmental Engineering.
  • Semiconductor Device Technology
  • Surface Coatings Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene