Study of Effects of Ionizing Radiation in Capacitors
Abstract
The results are presented in Tables in Appendix A. The data are tabulated by dielectric type. Beside the name of each material type is listed the number of capacitors of each capacitance value tested and the working voltage of each. As there were no capacitance-value-correlated trends in the data, the listings include data from all units, and the values given are usually averages over many test exposures. The dose is listed in rads (Si) for convenience. Since for high-energy electron energy deposition the energy deposited scales very nearly as Z/A, the doses can be considered as rads (dielectric material). The radiation pulse width and the decay constants (tau) are given in microseconds. The Q sub p and delta-Q values are in units of coulombs per farad-volt-rad, and the Q sub o values are in units of coulombs per farad-volt-rad-microsec. Where a definite voltage dependence of the specific charge release was observed, it is noted at the bottom of the listing. Lack of Q sub o and tau data for time intervals in which a delta-Q is listed implies that a linear interpolation may be used for obtaining intermediate points.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 20, 1970
- Accession Number
- ADA044789
Entities
People
- J. W. Harrity
- T. M. Flanagan