Asymptotic Failure Distributions

Abstract

This paper considers a single device shock model. The device is subject to shocks which can cause it to fail. It is assumed that the device will almost certainly survive a large number of shocks. Then the asymptotic form of the time to failure distribution of the shock model is found under weak assumptions on the shocking process. Specifically, conditions under which the time to failure distribution is approximately Increasing Failure Rate are found.

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Document Details

Document Type
Technical Report
Publication Date
Jun 27, 1977
Accession Number
ADA044894

Entities

People

  • Gary Gottlieb

Organizations

  • Stanford University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Brownian Motion
  • Convergence
  • Distribution Functions
  • Equations
  • Inequalities
  • Normal Distribution
  • Notation
  • Operations Research
  • Plastic Explosives
  • Probability
  • Probability Distributions
  • Random Variables
  • Sequences
  • United States
  • United States Government
  • Weak Convergence

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Integrated Circuit Design and Technology.
  • Regression Analysis.