Manufacturing Methods and Technology Engineering High Efficiency, High Power Gallium Arsenide Read-Type IMPATT Diodes.
Abstract
Group B testing of the confirmatory sample diodes was completed during the period, ending that phase of the program. All devices tested met specifications. Data is included herein. The Read profile wafers for the pilot production diodes were fabricated and met specifications. They were delivered to the production line. Wafer characterization data is included herein, as well as evaluation data on the first two wafers subsequent to sample diode assembly on the production line. The fifth X-band life test was completed. The sixth X and Ku-band life tests were also completed. Results are discussed herein. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1977
- Accession Number
- ADA045091
Entities
People
- H. R. Chalifour
- S. R. Steele
Organizations
- RTX