Sensitive Laser Spectroscopy Measurement Technique.
Abstract
A simple differential measurement technique is described by means of which a sensitive determination can be made of a change in the laser-beam signal resulting from absorption, scattering, or gain while traversing a medium. The method depends upon the use of an internally modulatable laser for implementation. Sensitivities of delta I/I sub 0 = .0001 were routinely and unambiguously measured. Maximum sensitivity was measured at .00002. The method is applicable, in general, to steady phenomena or average value measurements. Two silicon photovoltaic detectors are employed in the differential measurement. The applicable wavelength domain of this technique is determined by the sensitivity range of the detectors, i.e., approximately 0.19 to 1.15 micrometers. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 23, 1977
- Accession Number
- ADA045955
Entities
People
- Donald J. Spencer
Organizations
- The Aerospace Corporation