A Reflectometer Facility for the Measurement of Transmission and Reflection of Light at Normal Incidence.

Abstract

A reflectometer facility has been developed to measure the normal incidence transmission and reflection of light from flat surfaces. The reflectometer is used to aid the study of the optical properties of thin film systems and some measurements are used to calculate the optical constants of substrates and thin films. The reflectometer facility and the procedure for alignment of the reflectometer is described. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1977
Accession Number
ADA046439

Entities

People

  • J. R. Venning

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Amplifiers
  • Automatic Gain Control
  • Ceramic Materials
  • Classification
  • Measurement
  • Optical Properties
  • Physical Properties
  • Physics
  • Reflectance
  • Reflection
  • Reflectivity
  • Reflectometers
  • Refractive Index
  • Scattering
  • Substrates
  • Thin Films

Fields of Study

  • Physics

Readers

  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Thin Film Deposition Science.