ATS-6 Observations of Ionospheric/Protonospheric Electron Content and Flux.

Abstract

The ATS-6 radio beacon experiment carried out at Aberystwyth (52.42 N, 4.05 W) is described. A preliminary analysis of the data is described concentrating on hourly values of total electron content (N sub T), Faraday content (N sub F), protonospheric content (N sub P) and layer shape F-factor. The monthly media behaviour of the parameters is discussed together with the effects of observational and analysis error on the accuracy of the protonospheric content values. The correction for layer height changes has been found to be of much less importance for European stations observing during Phase II ATS-6 operations than for measurements made in America during Phase I. The dynamic interchange of plasma between ionosphere and protonosphere has been studied by estimating hourly values of average integrated net fluxes from the temporal gradient of protonospheric content. The protonospheric flux data have been interpreted qualitatively in terms of diffusive interaction between ionosphere and protonosphere in both local and conjugate hemispheres. Added confirmation is obtained by consideration of contrasting protonospheric data from an American sector station which can also be related to ionospheric behaviour in the two hemispheres.

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Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1977
Accession Number
ADA046762

Entities

People

  • H. Kajeb-hosseinieh
  • K. J. Edwards
  • L. Kersley

Organizations

  • Aberystwyth University

Tags

Communities of Interest

  • Space

DTIC Thesaurus Topics

  • Accuracy
  • Beacons
  • Case Studies
  • Diurnal Variations
  • Electrons
  • Elements
  • Frequency
  • Geosynchronous Satellites
  • Ionosondes
  • Ionosphere
  • Magnetic Storms
  • Measurement
  • Plasmids
  • Plastic Explosives
  • Radio Beacons
  • Recording Systems
  • Transmitters

Fields of Study

  • Environmental science

Readers

  • Astronomy and Astrophysics.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics