Electronic Measurement of Crystal Resonator Temperature Anomalies.
Abstract
The frequency- or immittance-temperature anomalies occurring in quartz crystal resonators are called activity dips. Testing for their presence can represent a considerable addition to the manufacturing cost. An electronic method is described that is rapid, simple, and well adapted to microprocessor control. It makes use of the fact that the desired mode of vibration is shifted in frequency by a variable series capacitor, while interfering modes that cause activity dips are nearly unaffected. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1977
- Accession Number
- ADA047566
Entities
People
- Arthur D. Ballato
- Richard Tilton
Organizations
- United States Army Communications-Electronics Command