Reliability Evaluation of Programmable Read-only Memories (PROMs) Part II.

Abstract

The primary objectives of this study were to: (1) assess factors affecting the reliability of three types of Programmable Read-Only Memories (PROMs), namely Polysilicon Fuse, Avalanche-Induced-Migration (AIM) and Nichrome Fuse Technologies, (2) Investigate fusing and associated failure mechanisms and (3) Assess the reliability of these PROM's via a life test.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1977
Accession Number
ADA048231

Entities

People

  • K. L. Wong
  • P. C. Mcmahan
  • R. L. Long Jr.
  • T. M. Donnelly
  • W. W. Powell

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemical Vapor Deposition
  • Corrosion Resistance
  • Crystal Structure
  • Drop Tests
  • Electron Microscopes
  • Electron Microscopy
  • Failure Mode And Effect Analysis
  • Films
  • Life Tests
  • Manufacturing
  • Materials
  • Microscopes
  • Semiconductor Devices
  • Semiconductors
  • Standards
  • Test And Evaluation
  • Transistors

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Integrated Circuit Design and Technology.
  • Software Engineering