Flight Test Data Comparing Electron Attachment by Ablation Products and by Liquid Injection,
Abstract
Teflon ablation as a mechanism for altering the electron concentration in the flow surrounding a vehicle was examined under reentry conditions. This was a companion flight to a liquid injection test which used Freon 114B2. Data will be presented on the effect of the ablation products on the flow. These results will then be compared with those of the injection flight. Measurements were obtained by microwave techniques and paired electrostatic probe measurements of positive ion and electron densities. The results of both tests showed significant electron reduction with the dominant mechanism being negative ion formation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1975
- Accession Number
- ADA048372
Entities
People
- Dallas T. Hayes
- J. Leon Poirier
- John F. Lennon
- Sheldon B. Herskovitz
Organizations
- Air Force Cambridge Research Laboratories