Some Numerical Results on Asymptotic Failure Distributions.

Abstract

Consider a single device shock model. The device is subject to shocks from the environment and eventually a shock will cause the device to fail. In an earlier paper, an asymptotic approximation for the time-to-failure distribution of the device was given. This paper computes numerically the actual time-to-failure distribution for various cases and then compare these distributions with the asymptotic approximations.

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Document Details

Document Type
Technical Report
Publication Date
Oct 14, 1977
Accession Number
ADA049775

Entities

People

  • Gary Gottlieb

Organizations

  • Stanford University

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Contracts
  • Convergence
  • Environment
  • Equations
  • Governments
  • Laplace Transformation
  • Malfunctions
  • Mathematics
  • Operations Research
  • Sequences
  • Stochastic Processes
  • Universities

Fields of Study

  • Mathematics

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Computational Modeling and Simulation
  • Finite Element Method (FEM) for solving Partial Differential Equations (PDEs)