Stored Charge Release in Cables in Low Fluence X-Ray Environments.
Abstract
Stored charge release in cables exposed to low fluence X-radiation has been investigated in the SPI-6000 X-ray simulator. No anomalous response in vacuum has been observed in all cable samples except semirigid cables. However, even for semirigid cables this anomalous behavior disappears if the cable is not bent. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 08, 1977
- Accession Number
- ADA050112
Entities
People
- Charles E. Wuller
- David M. Clement
- L. Carlisle Nielsen
- T. J. Sheppard