Failure Rate Mathematical Models for Discrete Semiconductors.

Abstract

This study revises and updates the appropriate sections of Military Handbook 217B, 'Reliability Prediction of Electronic Equipment,' pertaining to semi-conductor devices, section 2.2. More than 200 billion part-hours of field operating data were collected and analyzed during the study effort. Significant revisions were made to environmental factors and some quality factors. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1978
Accession Number
ADA050181

Entities

People

  • Donald F. Cottrell
  • Thomas W. Butler
  • William M. Maynard

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Aerospace Industry
  • Aircrafts
  • Amplifiers
  • Data Analysis
  • Databases
  • Detectors
  • Diodes
  • Electronic Equipment
  • Engineering
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Mathematical Models
  • Plastic Explosives
  • Pulse Amplifiers
  • Semiconductor Devices
  • Semiconductors
  • Standards

Readers

  • Computational Modeling and Simulation
  • Computer Science.
  • Inertial Navigation Systems.

Technology Areas

  • Microelectronics