Support of MX Electromagnetic Pulse Validation, Interim Report.

Abstract

This interim report outlines the technical progress to date on the Electrical Overstress Program at the US Army Missile Research and Development Command. The program is aimed at providing a better theoretical model of the physics of second breakdown in junction bipolar diodes, transistors, and integrated circuits, and applying this information in the development of nondestructive screening techniques for eliminating device types and individual samples which are especially susceptible to high power pulses. The program features a continuation of Defense Nuclear Agency funded research using special silicon on sapphire diodes in which the effects of self-heating are directly observable, computer analysis and simulation of both conventional transistor and special silicon on sapphire diode behavior, and selection and measurement of electrical parameters required for prediction of overstress susceptibility. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1977
Accession Number
ADA050257

Entities

People

  • David Mathews

Tags

Communities of Interest

  • Advanced Electronics
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Bipolar Junction Transistors
  • Cartesian Coordinates
  • Current Density
  • Differential Equations
  • Electric Fields
  • Electronics Laboratories
  • Field Effect Transistors
  • Measurement
  • Npn Transistors
  • P-N Junctions
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Temperature Gradients
  • Transistors

Fields of Study

  • Physics

Readers

  • Missile Defense Systems.
  • Semiconductor Device Technology
  • Software Engineering